SEM & EDS Analysis Laboratories
Scanning electron microscopy produces high-magnification images of surfaces, and with energy dispersive spectroscopy also gives elemental information about features and particles.
What does it measure?
- Surface and fracture morphology
- Elemental composition of features and particles
- Coating thickness in cross-section
- Contamination and residue identification
When is it used?
- Fractography during failure analysis
- Particle and contaminant identification
- Weld, solder and plating examination
- Cleanliness investigations
Sample considerations
- Specimens must fit the chamber and be vacuum-compatible; non-conductive materials may need coating.
- Preserve the region of interest — avoid touching or cleaning surfaces to be imaged.
Laboratories with relevant capabilities
- ASAMS (Great Yarmouth, Norfolk) — Failure Analysis, Metallurgical Testing, Materials Testing
- Anderson Materials Evaluation (Columbia, MD) — Surface Analysis, Materials Testing, Failure Analysis
- Intertek (Lake Forest, CA) — Materials Testing, Metallurgical Analysis, Chemical Analysis
- Metallurgical Technologies (Mooresville, NC) — Failure Analysis, Metallurgical Analysis, Mechanical Testing
- TÜV Rheinland of North America (Pleasanton, CA) — Electrical & EMC, Wireless & RF, Product Safety
- EAG Laboratories (Sunnyvale, CA) — Semiconductor Analysis, Failure Analysis, Reliability Testing
Frequently asked questions
- Does EDS give exact quantities?
- EDS is best treated as semi-quantitative for most practical work; for accurate bulk composition, laboratories use dedicated elemental methods.
Confirm standard edition, jurisdiction and actual laboratory scope. Service references are not partnerships or endorsements.